14 آذر 1404
مراد عليزاده

مراد علیزاده

مرتبه علمی: دانشیار
نشانی: دانشکده مهندسی سیستم های هوشمند و علوم داده - گروه آمار
تحصیلات: دکترای تخصصی / امار ریاضی
تلفن: 0
دانشکده: دانشکده مهندسی سیستم های هوشمند و علوم داده

مشخصات پژوهش

عنوان A novel compounding loss model with applications, mean-of-order-P and PORT-VaR analysis under the USA insurance losses
نوع پژوهش مقالات در نشریات
کلیدواژه‌ها
Compounding loss model · Xgamma-exponential distribution · Meanof-order P · Value-at-risk · USA insurance losses
مجله Sao Paulo Journal of Mathematical Sciences
شناسه DOI 10.1007/s40863-025-00515-1
پژوهشگران مراد علیزاده (نفر اول) ، گاوس کردیرو (نفر دوم) ، ضیاالرحمن رامکی (نفر سوم) ، جاویر ای کونتراس ریس (نفر چهارم) ، هیثم یوسف (نفر پنجم)

چکیده

We introduce an innovative compounded loss model, which integrates features from the Xgamma and exponential distributions to effectively capture the intricate distributional patterns observed in insurance loss data. A key focus of our study is an extensive empirical investigation that evaluates the Mean-of-Order-P (MO(P ) ) approach within the new compounded loss framework. Through comprehensive simulations using a large dataset and varying P from 1 to 50, we rigorously examine the ability of the empirical moments to capture higher-order statistical characteristics. This empirical study not only confirms the effectiveness of the MO(P ) but also provides valuable insights into its practical application across different orders of P. Further, we explore the practical utility of the proposed approach and the peaks over random thresholds Value-at-Risk (PORT-VaR) analysis specifically within the context of USA insurance losses. By applying these methodologies, insurers can assess and manage their exposure to extreme events more effectively, thereby bolstering their risk management strategies and ensuring financial stability. In this context, we present some mathematical properties of the new distribution along with a simulation study to evaluate some classical estimation methods with two applications, one in medicine and the other in reliability.