|
Abstract
|
The paper deals with muonic X-ray generation by a two-layer solid hydrogen structure of H2–D2 sD2. The target has
a high efficiency for analyzing characteristic X-rays in ion implantation. To predict the effect of the presence of protons on X-ray
production, we have proposed a new kinetic schema. Muonic object equations have been written to descibe all muonic processes.
In the case of a low concentration of argon (Ar) ions (5 ppm) in the sD2 layer a proton concentration of about 20% leads to a
significant drop in the X-ray yield. However, in the case of a high Ar concentration (500 ppm) this effect is negligible.
|