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Abstract
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In this study, the effect of repetition rate of pulsed laser on the magnetic properties of strontium hexaferrite thin films studied in detail. The epitaxial strontium hexaferrite thin films were grown on sapphire Al2O3 (0001) substrate using pulsed laser deposition (PLD) technique. The magnetic properties of the samples were investigated by vibrating sample magnetometery (VSM) and Raman spectroscopy. Magnetic property measurements of the SrM films with different frequency were conducted along in-plane easy ([0001]) and hard ([1010]) axes using VSM. Also, the variation of the magnetic properties such as saturation magnetization (Ms), remanent magnetization (Mr) and coercivity (Hc) are calculated from hysteresis loops. The in plane and out-of-plane magnetic hysteresis loops, which were measured at room temperature, showed a change out-of-plane anisotropy when the deposition rate was increased. Raman spectroscopy shows that the Raman spectra of the thin films are similar to those obtained for the powder.
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