حسین نیک منش

In this study, the epitaxial strontium hexaferrite thin films were grown on sapphire Al2O3 (0001) substrate using pulsed laser deposition (PLD) technique. The effect of frequency pulsed laser on the structural properties of thin films studied in detail. The choice of Al2O3 (0001) substrate is motivated by its hexagonal structure with a small lattice mismatch to SrFe12O19, which is required for epitaxial growth of ferrite thin films. The structural properties of the samples were investigated by X-ray diffraction (XRD), atomic force microscope (AFM). The XRD measurements revealed a well-crystallized with single phase M-type ferrite and textured films. The surface morphology using AFM images of the films show a smooth surface and by increasing laser repetition rate from 2 to 10 Hz, the lateral size of assembled particles on film surface decreased.